MICRODIFFRACTION INSTRUMENTATION AND EXPERIMENTS ON THE MICROFOCUS BEAMLINE AT THE ESRF

被引：55

作者：

ENGSTROM, P

FIEDLER, S

RIEKEL, C

机构：

[1] ESRF, F-38043 Grenoble

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 02期

关键词：

D O I：

10.1063/1.1145971

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A microfocus beamline has been installed at an ESRF undulator. The applications of this beamline will be mainly in diffraction and diffuse scattering. An ellipsoidal mirror has been commissioned which results in a flux of 2×1011 Ph/s in a 10 μm (circular) collimated beam at 13 keV at a bandwidth of about 3 eV. Further tests on capillary optics and Bragg-Fresnel optics have been done. © 1995 American Institute of Physics.

引用

页码：1348 / 1350

页数：3

共 9 条

[1] KIRKPATRICK-BAEZ MICROPROBE ON THE BASIS OF 2 LINEAR SINGLE-CRYSTAL BRAGG-FRESNEL LENSES
BONSE, U
RIEKEL, C
SNIGIREV, AA
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) : 622 - 624
[2] BOSECKE P, 1993, ESRF NEWSLETTER, V17, P10
[3] A SUBMICRON SYNCHROTRON X-RAY-BEAM GENERATED BY CAPILLARY OPTICS
ENGSTROM, P
LARSSON, S
RINDBY, A
BUTTKEWITZ, A
GARBE, S
GAUL, G
KNOCHEL, A
LECHTENBERG, F
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1991, 302 (03) : 547 - 552
[4] ENGSTROM P, 1991, DEV CAPILLARY OPTICS
[5] SUBMICROMETER FLUORESCENCE MICROPROBE BASED ON BRAGG-FRESNEL OPTICS
KUZNETSOV, SM
SNIGIREVA, II
SNIGIREV, AA
ENGSTROM, P
RIEKEL, C
[J]. APPLIED PHYSICS LETTERS, 1994, 65 (07) : 827 - 829
[6] 2 HIGH BRILLIANCE BEAM LINES AT THE ESRF DEDICATED TO MICRODIFFRACTION, BIOLOGICAL CRYSTALLOGRAPHY, AND SMALL-ANGLE SCATTERING (INVITED)
RIEKEL, C
BOSECKE, P
DELRIO, MS
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) : 974 - 981
[7] SMALL-ANGLE X-RAY-SCATTERING AT THE EUROPEAN SYNCHROTRON-RADIATION FACILITY
RIEKEL, C
BOSECKE, P
DIAT, O
ENGSTROM, P
KOCSIS, M
LEQUIEN, S
SNIGIREV, A
SNIGIREVA, I
TOTH, K
[J]. JOURNAL DE PHYSIQUE IV, 1993, 3 (C8): : 403 - 410
[8] RIEKEL C, 1993, P SOC PHOTO-OPT INS, V1740, P181, DOI 10.1117/12.138700
[9] SNIGIREV AA, 1994, J PHYS-PARIS, V3, P443

← 1 →