ELECTROMAGNETIC-FIELDS IN 2-DIMENSIONAL MODELS OF NEAR-FIELD OPTICAL MICROSCOPE TIPS

被引：15

作者：

CASTIAUX, A

DEREUX, A

VIGNERON, JP

GIRARD, C

MARTIN, OJF

机构：

[1] UNIV FRANCHE COMTE,PHYS MOLEC LAB,CNRS,UA 772,F-25030 BESANCON,FRANCE

[2] ETH ZENTRUM,INST FIELD THEORY & HIGH FREQUENCY ELECTR,CH-8092 ZURICH,SWITZERLAND

来源：

ULTRAMICROSCOPY | 1995年 / 60卷 / 01期

关键词：

D O I：

10.1016/0304-3991(95)00089-J

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The design of tips is of outstanding importance to obtain maximal efficiency in scanning near-field microscopy. As a support towards this optimization, this work presents the computation of the electromagnetic field penetrating into two-dimensional tips. The investigated geometries consist of elongated two-dimensional dielectric slabs (glass) terminated by pointed tips. Distributions of the electric field amplitude inside and outside two-dimensional models of tips are computed and from those solutions, far-field differential cross-sections are obtained.

引用

页码：1 / 9

页数：9

共 17 条

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[2]

[Anonymous], 1985, HDB OPTICAL CONSTANT

[3]

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[4]

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