STRUCTURAL STUDY OF ULTRATHIN SN LAYERS DEPOSITED ONTO GE(111) AND SI(111) SURFACES BY RHEED

被引：75

作者：

ICHIKAWA, T

机构：

来源：

SURFACE SCIENCE | 1984年 / 140卷 / 01期

关键词：

D O I：

10.1016/0039-6028(84)90380-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：37 / 63

页数：27

共 8 条

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[7] SOME NEW TECHNIQUES IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) APPLICATION TO SURFACE-STRUCTURE STUDIES [J].

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