MICROSTRAINS AND DOMAIN SIZES IN BI-CU-O SUPERCONDUCTORS - AN X-RAY-DIFFRACTION PEAK-BROADENING STUDY

被引:15
作者
BALZAR, D
LEDBETTER, H
机构
[1] National Institute of Standards and Technology, Boulder, 80303, CO
关键词
D O I
10.1007/BF00729647
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
[No abstract available]
引用
收藏
页码:1419 / 1420
页数:2
相关论文
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