THERMAL-DESORPTION STUDIES OF SILICON DIOXIDE DEPOSITED BY ATMOSPHERIC-PRESSURE CHEMICAL-VAPOR-DEPOSITION USING TETRAETHYLORTHOSILICATE AND OZONE

被引:29
作者
MURASE, K [1 ]
YABUMOTO, N [1 ]
KOMINE, Y [1 ]
机构
[1] NIPPON TELEGRAPH & TEL PUBL CORP, INTERDISCIPLINARY RES LABS, ATSUGI, KANAGAWA 24301, JAPAN
关键词
D O I
10.1149/1.2221631
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The relationship between the structural properties of TEOS/O3-NSG and deposition conditions is studied with thermal desorption spectroscopy. The principal thermally desorbed species, except for O2, are divided into two categories: H2O-related species and ethoxyl-group-related species. Most part of the H2O-related species, such as H2O, OH, O and H-2, are generated from silanol groups rather than actual water in the oxide. In contrast with O-atom desorption, O2-molecule desorption is not synchronized with H2O desorption. It is likely that desorbed O2 has its origin in ozone included in the source gas. The ethoxyl-group-related species, including OC2H5, OC2H4, C2H5, and C2H4, arise from components that have been incorporated into the oxide atomic network due to the incompleteness of TEOS decomposition. The dependence of thermal desorption spectra on source-gas composition and deposition temperature is described.
引用
收藏
页码:1722 / 1727
页数:6
相关论文
共 13 条
[1]  
[Anonymous], 1962, VACUUM
[2]  
ATKINS PW, 1986, PHYSICAL CHEM, pCH31
[3]   DOPED SILICON-OXIDE DEPOSITION BY ATMOSPHERIC-PRESSURE AND LOW-TEMPERATURE CHEMICAL VAPOR-DEPOSITION USING TETRAETHOXYSILANE AND OZONE [J].
FUJINO, K ;
NISHIMOTO, Y ;
TOKUMASU, N ;
MAEDA, K .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1991, 138 (10) :3019-3024
[4]   DEPENDENCE OF DEPOSITION CHARACTERISTICS ON BASE MATERIALS IN TEOS AND OZONE CVD AT ATMOSPHERIC-PRESSURE [J].
FUJINO, K ;
NISHIMOTO, Y ;
TOKUMASU, N ;
MAEDA, K .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1991, 138 (02) :550-554
[5]   SILICON DIOXIDE DEPOSITION BY ATMOSPHERIC-PRESSURE AND LOW-TEMPERATURE CVD USING TEOS AND OZONE [J].
FUJINO, K ;
NISHIMOTO, Y ;
TOKUMASU, N ;
MAEDA, K .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1990, 137 (09) :2883-2887
[6]  
GROVE AS, 1967, PHYS TECHNOL S, pCH2
[7]  
KOTANI H, 1989, IEEE IEDM, V89, P669
[8]  
MAHAN BH, 1965, U CHEMISTRY, pCH12
[9]  
MATSUURA M, 1990, 22ND C SOL STAT DEV, P239
[10]  
NISHIMOTO Y, 1987, 19TH C SOL STAT DEV, P447