DETAILED BALANCE IN SINGLE-CHARGE TRAPS

被引：22

作者：

BAUERNSCHMITT, R

NAZAROV, YV

机构：

[1] Institute f̈r Theoretische Festkörperphysik, Universität Karlsruhe, D-7500 Karlsruhe 1

来源：

PHYSICAL REVIEW B | 1993年 / 47卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.47.9997

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We propose a model to explain recent experimental results concerning the charge trapping in a system of ultrasmall tunnel junctions. Degradation processes in the system are assumed to generate the strange single-electron jumps observed. The model predicts many spectacular features of charge trapping so that it can easily be verified.

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页码：9997 / 10000

页数：4

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