MICROX (TM) - AN ALL-SILICON TECHNOLOGY FOR MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS

被引:34
作者
HANES, MH
AGARWAL, AK
OKEEFFE, TW
HOBGOOD, HM
SZEDON, JR
SMITH, TJ
SIERGIEJ, RR
MCMULLIN, PG
NATHANSON, HC
DRIVER, MC
THOMAS, RN
机构
[1] Westinghouse Science and Technology, Cent, Pittsburgh, PA
关键词
D O I
10.1109/55.215173
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An improved silicon-on-insulator (SOI) approach offers devices and circuits operating to 10 GHz by providing formerly unattainable capabilities in bulk silicon: reduced junction-to-substrate capacitances in FET's and bipolar transistors, inherent electrical isolation between devices, and low-loss microstrip lines. The concept, called MICROX(TM) (patent pending), is based on the SIMOX process, but uses very high-resistivity (typically > 10 000 OMEGA.cm) silicon substrates. MICROX NMOS transistors of effective gate length (0.25 mum) give a maximum frequency of operation, f(max) of 32 GHz and f(T) of 23.6 GHz in large-periphery (4 x 50 mum) devices with no correction for the parasitic effects of the pads. The measured minimum noise figure is 1.5 dB at 2 GHz with associated gain of 17.5 dB, an improvement over previously reported values for silicon FET's.
引用
收藏
页码:219 / 221
页数:3
相关论文
共 7 条
[1]  
Agarwal A. K., 1991, International Electron Devices Meeting 1991. Technical Digest (Cat. No.91CH3075-9), P687, DOI 10.1109/IEDM.1991.235329
[2]   MICROWAVE PERFORMANCE OF SOI N-MOSFETS AND COPLANAR WAVE-GUIDES [J].
CAVIGLIA, AL ;
POTTER, RC ;
WEST, LJ .
IEEE ELECTRON DEVICE LETTERS, 1991, 12 (01) :26-27
[3]  
HOBGOOD HM, 1990, SEMICONDUCTOR SILICO, V90
[4]  
KELLER W, 1981, FLOATING ZONE SILICO, P105
[5]   HIGH-FREQUENCY PERFORMANCE OF SUBMICROMETER CHANNEL-LENGTH SILICON MOSFETS [J].
RAYNAUD, C ;
GAUTIER, J ;
GUEGAN, G ;
LERME, M ;
PLAYEZ, E ;
DAMBRINE, G .
IEEE ELECTRON DEVICE LETTERS, 1991, 12 (12) :667-669
[6]   A DEEP-SUBMICROMETER MICROWAVE DIGITAL CMOS SOS TECHNOLOGY [J].
SCHMITZ, AE ;
WALDEN, RH ;
LARSON, LE ;
ROSENBAUM, SE ;
METZGER, RA ;
BEHNKE, JR ;
MACDONALD, PA .
IEEE ELECTRON DEVICE LETTERS, 1991, 12 (01) :16-17
[7]  
Su L. T., 1991, International Electron Devices Meeting 1991. Technical Digest (Cat. No.91CH3075-9), P367, DOI 10.1109/IEDM.1991.235377