SIMULTANEOUS INTERROGATION OF INTERFEROMETRIC AND BRAGG GRATING SENSORS

被引:17
作者
BRADY, G [1 ]
KALLI, K [1 ]
WEBB, DJ [1 ]
JACKSON, DA [1 ]
REEKIE, L [1 ]
ARCHAMBAULT, JL [1 ]
机构
[1] UNIV SOUTHAMPTON,OPT ELECTR RES CTR,SOUTHAMPTON SO9 5NH,HANTS,ENGLAND
关键词
Interferometers - Mirrors - Optical filters - Optical resolving power - Phase shift - Photodiodes - Piezoelectric transducers - Signal detection - Signal to noise ratio - Strain;
D O I
10.1364/OL.20.001340
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We propose a new method for the simultaneous interrogation of conventional two-beam interferometers and Bragg grating sensors. The technique employs an unbalanced Mach-Zehnder interferometer illuminated by a single low-coherence source, which acts as a wavelength-tunable source for the grating and as a path-matched filter for the Fizeau interferometer, thus providing a high phase resolution output for each sensor. The grating sensor demonstrates a dynamic strain resolution of similar to 0.05 mu epsilon/root Hz at 20 Hz, while the interferometric phase resolution is better than 1 mrad/root Hz at 20 Hz, corresponding to an rms mirror displacement of 0.08 nm.
引用
收藏
页码:1340 / 1342
页数:3
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