OBSERVATION AND SURFACE MODIFICATION OF ELECTROPOLYMERIZED POLY(N-METHYLPYRROLE) USING ATOMIC-FORCE MICROSCOPY

被引：15

作者：

YANO, T

NAGAHARA, LA

HASHIMOTO, K

FUJISHIMA, A

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 03期

关键词：

D O I：

10.1116/1.587294

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have used atomic force microscopy (AFM) to investigate the surface morphology of poly(N-methylpyrrole) after electropolymerization on indium tin oxide and highly oriented pyrolytic graphite (HOPG) surfaces. We have found that the polymer surface became rougher with higher current density or lower solution temperature. In situ observations of the initial stages of electropolymerization revealed that an extremely weak adhesion exists between the polymer and HOPG. As a result, the AFM tip-sample interaction could easily move the polymer, and we have proposed that this can be used for patterning surfaces.

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页码：1596 / 1599

页数：4

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