SENSITIVITY AMPLIFICATION BY SAMPLE PRECONCENTRATION IN ION-BEAM ANALYSIS

被引：7

作者：

ANNEGARN, HJ

ERASMUS, CS

SELLSCHOP, JPF

TREDOUX, M

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 218卷 / 1-3期

关键词：

The authors acknowledge with appreciation the support of the de Beers Diamond Research Laboratory; the SA Council for Scientific and Industrial Research; the SA Nuclear Development Corporation; the SA Council for Mineral Technology and the University of the Witwatersrand;

D O I：

10.1016/0167-5087(83)90950-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：33 / 38

页数：6

共 7 条

[1] CLIFTON HE, 1962, GEOL SURVEY PROF P C, V625, pC1
[2] ERASMUS CS, 1977, NBS SPEC PUBL, V464, P129
[3] ERASMUS CS, 1982, TM10928 COUNC MIN TE
[4] HAINES J, 1982, M34 COUNC MIN TECHN
[5] ROBERT RVD, 1971, 1371 NAT I MET REP
[6] STEELE TW, 1975, 1966 NAT I MET REP
[7] A VERSATILE CHARGED-PARTICLE ACTIVATION TECHNIQUE FOR THE ANALYSIS OF THE NOBLE-METALS
TREDOUX, M
SELLSCHOP, JPF
WATTERSON, JIW
ERASMUS, CS
[J]. JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1983, 76 (01): : 171 - 180

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