SUBNANOSECOND RELAXATION-TIME MEASUREMENTS USING A TRANSIENT INDUCED GRATING METHOD

被引：163

作者：

PHILLION, DW ^{[1
]}

KUIZENGA, DJ ^{[1
]}

SIEGMAN, AE ^{[1
]}

机构：

[1] STANFORD UNIV, MICROWAVE LAB, STANFORD, CA 94305 USA

来源：

APPLIED PHYSICS LETTERS | 1975年 / 27卷 / 02期

关键词：

D O I：

10.1063/1.88362

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：85 / 87

页数：3

相关论文

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