STUDIES OF TUNGSTEN-OXIDE ELECTROCHROMIC THIN-FILMS AND POLYCRYSTALS BY THE EXAFS METHOD

被引：4

作者：

BETS, V

VEISPALS, A

LUSIS, A

PURANS, J

RAMANS, G

SHEROMOV, M

KOCHUBEI, D

FEDOROV, V

机构：

[1] ACAD SCI USSR,INST NUCL PHYS,NOVOSIBIRSK,USSR

[2] ACAD SCI USSR,INST CATALYSIS,NOVOSIBIRSK,USSR

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1987年 / 261卷 / 1-2期

关键词：

D O I：

10.1016/0168-9002(87)90593-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：175 / 177

页数：3

共 9 条

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