ELECTRON-ENERGY LOSS NEAR EDGE STRUCTURE (ELNES), A POTENTIAL TECHNIQUE IN THE STUDIES OF LOCAL ATOMIC ARRANGEMENTS

被引：74

作者：

TAFTO, J

ZHU, J

机构：

来源：

ULTRAMICROSCOPY | 1982年 / 9卷 / 04期

关键词：

D O I：

10.1016/0304-3991(82)90095-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：349 / 354

页数：6

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