VIBRATIONAL STUDY OF THE SIO2/SI INTERFACE BY HIGH-RESOLUTION ELECTRON-ENERGY LOSS SPECTROSCOPY

被引:48
作者
THIRY, PA [1 ]
LIEHR, M [1 ]
PIREAUX, JJ [1 ]
SPORKEN, R [1 ]
CAUDANO, R [1 ]
VIGNERON, JP [1 ]
LUCAS, AA [1 ]
机构
[1] FAC UNIV NOTRE DAME PAIX,PHYS MATH & PHYS SOLIDE LAB,B-5000 NAMUR,BELGIUM
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1985年 / 3卷 / 04期
关键词
D O I
10.1116/1.583065
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1118 / 1121
页数:4
相关论文
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