QUANTITATIVE PHOTOELECTRON-SPECTROSCOPY AS APPLIED TO NON-IDEAL SURFACES

[1] ABRAMOWITZ M, 1972, APPLIED MATH SERIES, V55, P228

[2] ANGEVINE PJ, 1976, 6TH P INT C CAT CHEM, V2, P611

[3] APPLICATION OF XPS TO THE DETERMINATION OF THE SIZE OF SUPPORTED PARTICLES IN A CATALYST-MODEL DEVELOPMENT AND ITS APPLICATION TO DESCRIBE THE SINTERING BEHAVIOR OF A SILICA-SUPPORTED PT FILM [J]. JOURNAL OF CATALYSIS, 1979, 58 (03) : 454 - 469

[4] KERKHOF FPJM, 1979, J PHYS CHEM-US, V83, P1612, DOI 10.1021/j100475a011

[5] KUIPERS H, UNPUB SURF INTERFACE

[6] Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103

[1] ABRAMOWITZ M, 1972, APPLIED MATH SERIES, V55, P228

[2] ANGEVINE PJ, 1976, 6TH P INT C CAT CHEM, V2, P611

[3] APPLICATION OF XPS TO THE DETERMINATION OF THE SIZE OF SUPPORTED PARTICLES IN A CATALYST-MODEL DEVELOPMENT AND ITS APPLICATION TO DESCRIBE THE SINTERING BEHAVIOR OF A SILICA-SUPPORTED PT FILM [J]. JOURNAL OF CATALYSIS, 1979, 58 (03) : 454 - 469

[4] KERKHOF FPJM, 1979, J PHYS CHEM-US, V83, P1612, DOI 10.1021/j100475a011

[5] KUIPERS H, UNPUB SURF INTERFACE

[6] Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103