ATOMIC IMAGING BY X-RAY-FLUORESCENCE HOLOGRAPHY AND ELECTRON-EMISSION HOLOGRAPHY - A COMPARATIVE THEORETICAL-STUDY

被引：84

作者：

LEN, PM ^{[1
]}

THEVUTHASAN, S ^{[1
]}

FADLEY, CS ^{[1
]}

KADUWELA, AP ^{[1
]}

VANHOVE, MA ^{[1
]}

机构：

[1] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,DIV MAT SCI,BERKELEY,CA 94720

来源：

PHYSICAL REVIEW B | 1994年 / 50卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.50.11275

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We consider from a theoretical viewpoint the direct imaging of atoms at and near the surfaces of solids by both x-ray-fluorescence holography (XFH) and electron-emission holography (EEH). The more ideal nature of re-ray scattering makes XFH images superior to those in single-energy EEH. The overlap of real and twin features for pairs of atoms at ra can cause their XFH or EEH atomic images to cancel for certain combinations of wave vector and \a\ The relative merits of XFH and EEH for structure Studies are considered.

引用

页码：11275 / 11278

页数：4

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