A REVIEW OF THE ANALYSIS OF SURFACES AND THIN-FILMS BY AES AND XPS

被引：73

作者：

SEAH, MP

机构：

来源：

VACUUM | 1984年 / 34卷 / 3-4期

关键词：

D O I：

10.1016/0042-207X(84)90084-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：463 / 478

页数：16

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