HIGH-TEMPERATURE ANNEALING OF HE+ ION-IMPLANTED QUARTZ OPTICAL WAVE-GUIDES

被引:26
作者
CHANDLER, PJ
ZHANG, L
TOWNSEND, PD
机构
[1] School of Mathematical and Physical Sciences, University of Sussex, Brighton
关键词
D O I
10.1016/0168-583X(90)90671-G
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The refractive index changes produced by high energy He+ ion implantation in crystalline quartz exhibit almost idealised behaviour for optical waveguide formation. There is a high efficiency for nuclear damage which amorphises the lattice at a low dose (< 1016 cm-2), producing a reduced refractive index optical barrier with - Δn ∼ 5%. The electronic stopping has very little effect on the index, and absorption due to colour centres is removed by annealing at ∼ 600°C. By means of multi-energy implants it is therefore not difficult to produce low loss guides (∼ 0.2 dB/cm) having a wide variety of profile specifications, and very easy to produce guides with almost square-barrier profiles. We report the annealing characteristics of these profiles at temperatures up to 1000 ° C where the high damage region of the barrier (- Δn > 2%) increases (towards the fused silica value) and the low damage region decreases towards that of crystalline quartz. The annealing behaviour is compared with that of ion-damaged fused silica. © 1990.
引用
收藏
页码:69 / 73
页数:5
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