THE RECORDING OF MICRODIFFRACTION PATTERNS IN SCANNING-TRANSMISSION ELECTRON-MICROSCOPY

被引：11

作者：

RODENBURG, JM

MCMULLAN, D

机构：

[1] Cavendish Lab, Cambridge, Engl, Cavendish Lab, Cambridge, Engl

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1985年 / 18卷 / 11期

关键词：

D O I：

10.1088/0022-3735/18/11/016

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：949 / 953

页数：5

共 18 条

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[2]

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[3] NANODIFFRACTION FROM PLATELET DEFECTS IN DIAMOND [J].

COWLEY, JM ;

OSMAN, MA ;

HUMBLE, P .

[4]

COWLEY JM, 1978, ADV ELECTRON ELECTRO, V46, P1

[5] SOURCE-DETECTOR SPECTRAL MATCHING FACTORS [J].

EBERHARDT, EH .

[6]

GOLDSTEIN JI, 1975, PRACTICAL SCANNING E, P56

[7]

Goldstein JI, 1977, SCANNING ELECTRON MI, V1, P315

[8]

GRANO DA, 1982, ULTRAMICROSCOPY, V7, P381

[9]

GRIBOVAL PJ, 1979, ADV ELECTRON ELECTRO, V52, P305

[10]

Grigson CWB, 1962, J ELECTRON CONTR, V12, P209