THE USE OF X-RAY-DIFFRACTION ROCKING CURVE METHODOLOGY FOR ASSESSMENT OF THE C-AXIS ORIENTATION IN BI-SR-CA-CU-O SUPERCONDUCTING THIN-FILMS

An X-ray diffraction theta scan rocking curve analysis method has been developed which allows one to assess the relative degree of c-axis preferred orientation of Bi-Sr-Ca-Cu-O superconducting ceramic thin films deposited on (100) MgO and Ag foil substrates. The full width at half maximum (FWHM) of the rocking curve peak is taken as a relative measure of c-axis orientation. Precision measurements of the data collection parameters, sample holder mounting, and instrument loading of the sample were performed. Defocusing of the X-ray beam was characterized using random alpha-Al2O3 powder and a (100) Si wafer. Rocking curves of the Bi-Sr-Ca-Cu-O 37 angstrom-110 K superconducting phase (0014) peak for a random powder, thin film on Ag substrate, and thin film on (100) MgO were obtained with FWHM values of > 20-degrees approximately 5-degrees and approximately 0.3-degrees theta, respectively.