COMPOSITIONAL ANALYSIS OF ELECTROSYNTHESIZED SEMICONDUCTOR THIN-FILMS BY ELECTROCHEMICAL QUARTZ CRYSTAL MICROGRAVIMETRY - APPLICATION TO THE CD PLUS SE SYSTEM

被引：22

作者：

WEI, C ^{[1
]}

BOSE, CSC ^{[1
]}

RAJESHWAR, K ^{[1
]}

机构：

[1] UNIV TEXAS,DEPT CHEM,ARLINGTON,TX 76019

来源：

JOURNAL OF ELECTROANALYTICAL CHEMISTRY | 1992年 / 327卷 / 1-2期

关键词：

D O I：

10.1016/0022-0728(92)80158-Z

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

[No abstract available]

引用

页码：331 / 336

页数：6

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