AUTOMATIC FRINGE ANALYSIS FOR MOIRE TOPOGRAPHY

被引：15

作者：

YATAGAI, T

IDESAWA, M

机构：

来源：

OPTICS AND LASERS IN ENGINEERING | 1982年 / 3卷 / 01期

关键词：

D O I：

10.1016/0143-8166(82)90018-5

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：73 / 83

页数：11

共 13 条

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[4]

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[6] PHASE-LOCKED MOIRE FRINGE ANALYSIS FOR AUTOMATED CONTOURING OF DIFFUSE SURFACES [J].

MOORE, DT ;

TRUAX, BE .

APPLIED OPTICS, 1979, 18 (01) :91-96

[7] ELECTRONIC PROCESSING OF MOIRE FRINGES - APPLICATION TO MOIRE TOPOGRAPHY AND COMPARISON WITH PHOTOGRAMMETRY [J].

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THOMAS, A .

APPLIED OPTICS, 1979, 18 (04) :563-574

[8] HETERODYNE INTERFEROMETRIC METHOD FOR PROFILING RECORDED MOIRE INTERFEROGRAMS [J].

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[9]

SHINOTO A, 1981, MOIRE FRINGE TOPOGRA

[10]

SUZUKI M, 1981, MOIRE FRINGE TOPOGRA

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