ABSOLUTE IONIZATION CROSS-SECTIONS FOR ELECTRON-IMPACT ON H-2

被引：34

作者：

KOSSMANN, H

SCHWARZKOPF, O

SCHMIDT, V

机构：

[1] Fakultat fur Physik, Universitat Freiburg, Freiburg

来源：

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 1990年 / 23卷 / 02期

关键词：

D O I：

10.1088/0953-4075/23/2/012

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Absolute electron impact cross sections for single ionisation leaving H2+in its electronic ground state and double ionisation leading to dissociation into all four constituents have been determined by a direct method in the energy range 0.15-2.6 keV. The values for single ionisation are in perfect agreement with, but the double-ionisation values are much larger than, the earlier determination by Edwards et al. (1988, 1989). The authors’ results exhibit a close relationship between the H2system and its atomic counterpart, helium, with respect to their response to single- and double-ionisation processes. © 1990 IOP Publishing Ltd.

引用

收藏

页码：301 / 313

页数：13

相关论文

共 27 条

[1] LOW-NOISE, HIGH-VOLTAGE SECONDARY-EMISSION ION DETECTOR FOR POLYATOMIC IONS [J].

BEUHLER, RJ ;

FRIEDMAN, L .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1977, 23 (02) :81-97

[2] DETECTION EFFICIENCY OF A CONTINUOUS CHANNEL ELECTRON MULTIPLIER FOR POSITIVE IONS [J].

BURROUS, CN ;

LIEBER, AJ ;

ZAVIANTSEFF, VT .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1967, 38 (10) :1477-+

[3] TOTAL CROSS-SECTIONS FOR ELECTRON-SCATTERING BY HE [J].

DEHEER, FJ ;

JANSEN, RHJ .

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1977, 10 (18) :3741-3758

[4]

DEHEER FJ, 1985, ELECTRON IMPACT IONI, P232

[5] DISSOCIATIVE IONIZATION OF H2 - A STUDY OF ANGULAR DISTRIBUTIONS AND ENERGY DISTRIBUTIONS OF RESULTANT FAST PROTONS [J].

DUNN, GH ;

KIEFFER, LJ .

PHYSICAL REVIEW, 1963, 132 (05) :2109-&

[6] DOUBLE IONIZATION AND IONIZATION PLUS EXCITATION OF H-2 BY FAST PROJECTILES [J].

EDWARDS, AK ;

WOOD, RM ;

DAVIS, JL ;

EZELL, RL .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1989, 40-1 :174-177

[7] SINGLE AND DOUBLE IONIZATION OF H2 BY ELECTRONS AND PROTONS [J].

EDWARDS, AK ;

WOOD, RM ;

BEARD, AS ;

EZELL, RL .

PHYSICAL REVIEW A, 1988, 37 (10) :3697-3701

[8] ABSOLUTE AND ANGULAR EFFICIENCIES OF A MICROCHANNEL-PLATE POSITION-SENSITIVE DETECTOR [J].

GAO, RS ;

GIBNER, PS ;

NEWMAN, JH ;

SMITH, KA ;

STEBBINGS, RF .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1984, 55 (11) :1756-1759

[9] 4D PHOTOIONISATION IN XENON - ABSOLUTE PARTIAL CROSS-SECTION AND RELATIVE STRENGTH OF 4D MANY-ELECTRON PROCESSES [J].

KAMMERLING, B ;

KOSSMAN, H ;

SCHMIDT, V .

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1989, 22 (06) :841-854

[10] UNEXPECTED BEHAVIOR OF DOUBLE PHOTOIONIZATION IN H2 [J].

KOSSMANN, H ;

SCHWARZKOPF, O ;

KAMMERLING, B ;

SCHMIDT, V .

PHYSICAL REVIEW LETTERS, 1989, 63 (19) :2040-2043