SUBJECTIVE MEASUREMENT OF HIGH-ORDER ABERRATIONS OF EYE

被引：62

作者：

HOWLAND, B

HOWLAND, HC

机构：

[1] MIT, ELECTR RES LAB, CAMBRIDGE, MA 02139 USA

[2] CORNELL UNIV, NEUROBIOL & BEHAV SECT, ITHACA, NY 14850 USA

来源：

关键词：

D O I：

10.1126/science.959814

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：580 / 582

页数：3

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