TESTING OF MIXED-SIGNAL SYSTEMS USING DYNAMIC STIMULI

被引：10

作者：

TAYLOR, D

EVANS, PSA

PRITCHARD, TI

机构：

[1] Division of Electronics & Communications, University of Huddersfield, Queensgate

来源：

ELECTRONICS LETTERS | 1993年 / 29卷 / 09期

关键词：

INTEGRATED CIRCUITS; TESTING;

D O I：

10.1049/el:19930542

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The impulse response of a linear circuit element contains enough information to functionally characterise that element. A technique for comparison of observed and expected (reference) transient responses, which results in an absolute measure of device functionality, is presented. Comparisons of transient response test results with the results from existing test programs are also presented.

引用

页码：811 / 813

页数：3