SIMPLIFIED METHOD FOR DETERMINATION OF INDUCED-EMISSION CROSS-SECTION OF NEODYMIUM DOPED GLASSES

被引：6

作者：

DEUTSCHBEIN, OKF

机构：

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1976年 / 12卷 / 09期

关键词：

D O I：

10.1109/JQE.1976.1069208

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：551 / 554

页数：4

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