FREE-SPACE MEASUREMENT OF COMPLEX PERMITTIVITY AND COMPLEX PERMEABILITY OF MAGNETIC-MATERIALS AT MICROWAVE-FREQUENCIES

被引:582
作者
GHODGAONKAR, DK [1 ]
VARADAN, VV [1 ]
VARADAN, VK [1 ]
机构
[1] PENN STATE UNIV,DEPT ENGN SCI & MECH,UNIVERSITY PK,PA 16802
关键词
D O I
10.1109/19.52520
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A free-space measurement system operating in the 8.2–40 GHz frequency range is used to measure the reflection and transmission coefficients, S11 and S2I, of planar samples. The complex electric permittivity and the magnetic permeability are calculated from the measured values of S11 and S2I. The measurement system consists of transmit and receive horn lens antennas, a network analyzer, mode transitions, and a computer. Diffraction effects at the edges of the sample are minimized by using spot-focusing lens antennas. Errors due to multiple reflections between antennas via the surface of the sample are corrected by using a free-space TRL (thru, reflect, line) calibration technique. For thin, flexible samples, the sample had to be sandwiched between two half-wavelength (at mid-band) quartz plates, to eliminate the effect of sagging. Results are reported in the frequency range of 8.6–13.4 GHz for materials such as Teflon, sodium borosilicate glass, and microwave-absorbing materials. © 1990 IEEE
引用
收藏
页码:387 / 394
页数:8
相关论文
共 20 条
[1]  
Amin M. B., 1981, Radio and Electronic Engineer, V51, P209, DOI 10.1049/ree.1981.0032
[2]   A BROAD-BAND, AUTOMATED, STRIPLINE TECHNIQUE FOR THE SIMULTANEOUS MEASUREMENT OF COMPLEX PERMITTIVITY AND PERMEABILITY [J].
BARRY, W .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1986, 34 (01) :80-84
[3]  
Chin G Y, 1985, REFERENCE DATA ENG R, P4
[4]   A NEW FREE-WAVE METHOD FOR FERRITE MEASUREMENT AT MILLIMETER WAVELENGTHS [J].
CULLEN, AL .
RADIO SCIENCE, 1987, 22 (07) :1168-1170
[5]  
DONECKER B, 1984, DETERMINING MEASUREM
[6]  
GAGNON DR, 1986, NWC TP6643 NAV WEAP, P39
[7]   A FREE-SPACE METHOD FOR MEASUREMENT OF DIELECTRIC-CONSTANTS AND LOSS TANGENTS AT MICROWAVE-FREQUENCIES [J].
GHODGAONKAR, DK ;
VARADAN, VV ;
VARADAN, VK .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (03) :789-793
[8]  
JOSEPH JC, 1986, THESIS AIR FORCE I T, P56
[9]  
JOSEPH JC, 1987, IEEE APS INT S, P640