FUNDAMENTAL STUDIES ON QUANTITATIVE-ANALYSIS OF O0, O- AND O2- IONS IN SILICATE BY X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：15

作者：

KANEKO, Y

SUGINOHARA, Y

机构：

[1] KYUSHU INST TECHNOL, GRAD SCH, KITAKYUSHU, JAPAN

[2] KYUSHU INST TECHNOL, DEPT MET, KITAKYUSHU, JAPAN

来源：

JOURNAL OF THE JAPAN INSTITUTE OF METALS | 1977年 / 41卷 / 04期

关键词：

D O I：

10.2320/jinstmet1952.41.4_375

中图分类号：

学科分类号：

摘要：

引用

页码：375 / 380

页数：6

共 10 条

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[7] X-RAY PHOTOELECTRON-SPECTROSCOPY OF MANGANESE-OXYGEN SYSTEMS [J].

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[8]

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[10] MOLECULAR-ORBITAL INTERPRETATION OF X-RAY-EMISSION AND ESCA SPECTRAL SHIFTS IN SILICATES [J].

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JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1973, 34 (02) :307-319

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