ELECTRIC-FIELD-INDUCED BIREFRINGENCE PROPERTIES OF HIGH-REFRACTIVE-INDEX GLASSES EXHIBITING LARGE KERR NONLINEARITIES

被引:15
作者
BORRELLI, NF
AITKEN, BG
NEWHOUSE, MA
HALL, DW
机构
[1] Corning Glass Research, Development and Engineering Division, Corning
关键词
D O I
10.1063/1.349363
中图分类号
O59 [应用物理学];
学科分类号
摘要
The electro-optic Kerr effect and its wavelength dispersion have been measured in glasses representing several compositional systems. The measured Kerr effect was found to be large for glasses having large refractive indices, including: (i) glasses containing high concentrations of the heavy metals Pb, Bi, and Tl; (ii) glasses with high Nb, Ta, and Ti content; and (iii) tellurite glasses. Comparison of the third-order nonlinear susceptibility, chi-eff(omega = omega + 0 + 0), obtained from the measured electro-optic data, to values estimated from literature values of the optical frequency value, chi-eff(omega = omega + omega - omega) suggest an opposition of the electronic and nuclear contributions to the low-frequency electro-optic effect for the glasses containing Ti, Ta, or Nb.
引用
收藏
页码:2774 / 2779
页数:6
相关论文
共 12 条
[1]  
BISHOP DM, 1988, PHYS REV LETT, V61, P22
[2]   ELECTRO-OPTIC EFFECT IN TRANSPARENT NIOBATE GLASS-CERAMIC SYSTEMS [J].
BORRELLI, NF .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (11) :4243-&
[3]  
BORRELLI NF, 1971, PHYS CHEM GLASSES, V12, P93
[4]  
BORRELLI NF, 1989, SPIE, V1128, P246
[5]  
BORRELLI NF, 1987, SPIE P, V843, P6
[6]   NONLINEAR OPTICAL-GLASSES FOR ULTRAFAST OPTICAL SWITCHES [J].
FRIBERG, SR ;
SMITH, PW .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1987, 23 (12) :2089-2094
[7]   NONLINEAR OPTICAL SUSCEPTIBILITIES OF HIGH-INDEX GLASSES [J].
HALL, DW ;
NEWHOUSE, MA ;
BORRELLI, NF ;
DUMBAUGH, WH ;
WEIDMAN, DL .
APPLIED PHYSICS LETTERS, 1989, 54 (14) :1293-1295
[8]   ORIGIN AND FREQUENCY-DEPENDENCE OF NONLINEAR OPTICAL SUSCEPTIBILITIES OF GLASSES [J].
HELLWARTH, R ;
CHERLOW, J ;
YANG, TT .
PHYSICAL REVIEW B, 1975, 11 (02) :964-967
[9]  
Jona F., 1962, FERROELECTRIC CRYSTA
[10]  
Mott N. F., 1940, ELECTRONIC PROCESSES