RADIATION EFFECTS ON X-RAY-MICROANALYSIS OF A LIGHT-ELEMENT ALLOY IN A MEDIUM-VOLTAGE ELECTRON-MICROSCOPE

被引：12

作者：

MANSFIELD, JF

OKAMOTO, PR

REHN, LE

ZALUZEC, NJ

机构：

来源：

ULTRAMICROSCOPY | 1987年 / 21卷 / 01期

关键词：

D O I：

10.1016/0304-3991(87)90003-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：13 / 21

页数：9

共 24 条

[1] FUNDAMENTAL-ASPECTS OF ION-BEAM MIXING [J].

AVERBACK, RS .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 15 (1-6) :675-687

[2]

BEHRISCH R, 1981, SPUTTERING PARTICL 1

[3]

BEHRISCH R, 1981, SPUTTERING PARTICL 2

[4]

CAUVIN R, 1981, THESIS U NANCY

[5]

CHELIKOWSKY JR, 1984, SURF SCI, V139, P1197

[6]

COOKE KE, 1977, I PHYS C SER, V36, P431

[7]

HOBBS LW, 1985, QUANTITATIVE ELECTRO, P583

[8] DETERMINATION OF FOIL THICKNESS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY [J].

KELLY, PM ;

JOSTSONS, A ;

BLAKE, RG ;

NAPIER, JG .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1975, 31 (02) :771-780

[9] COMPOSITIONAL REDISTRIBUTION IN ALLOY-FILMS UNDER HIGH-VOLTAGE ELECTRON-MICROSCOPE IRRADIATION [J].

LAM, NQ ;

LEAF, GK ;

MINKOFF, M .

JOURNAL OF NUCLEAR MATERIALS, 1983, 118 (2-3) :248-259

[10]

LAM NQ, 1985, ASTM STP, V870, P430

← 1 2 3 →