DETERMINATION OF THE OPTICAL-CONSTANTS AND THICKNESS OF AMORPHOUS V2O5 THIN-FILMS

被引：40

作者：

MICHAILOVITS, L

HEVESI, I

PHAN, L

VARGA, Z

机构：

来源：

THIN SOLID FILMS | 1983年 / 102卷 / 01期

关键词：

D O I：

10.1016/0040-6090(83)90259-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：71 / 76

页数：6

共 9 条

[1] OPTICAL-CONSTANTS OF ABSORBING MATERIALS BY TRANSMISSION INTERFEROMETRY ON MEDIUM-THICKNESS FILMS [J].

CASSET, J .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (05) :725-730

[2]

GAVRILYUK AI, 1979, PISMA ZH TEKH FIZ, V5, P1227

[3]

GONCHARENKO AM, 1963, OPT SPEKTROSK+, V14, P94

[4] OPTICAL INTERFERENCE METHOD FOR APPROXIMATE DETERMINATION OF REFRACTIVE-INDEX AND THICKNESS OF A TRANSPARENT LAYER [J].

GOODMAN, AM .

APPLIED OPTICS, 1978, 17 (17) :2779-2787

[5] OPTICAL PROPERTIES OF CADMIUM SULFIDE AND ZINC SULFIDE FROM 0.6-MICRON TO 14-MICRONS [J].

HALL, JF ;

FERGUSON, WFC .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1955, 45 (09) :714-718

[6] ON OPTICAL PROPERTIES OF VANADIUM PENTOXIDE SINGLE CRYSTALS [J].

HEVESI, I .

ACTA PHYSICA ACADEMIAE SCIENTIARUM HUNGARICAE, 1967, 23 (04) :415-&

[7] OPTICAL ABSORPTION COEFFICIENTS OF VANADIUM PENTOXIDE SINGLE CRYSTALS [J].

KENNY, N ;

KANNEWUR.CR ;

WHITMORE, DH .

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1966, 27 (08) :1237-&

[8] CHARACTERIZATION OF AMORPHOUS VANADIUM PENTOXIDE THIN-FILMS PREPARED BY CHEMICAL VAPOR-DEPOSITION (CVD) AND VACUUM DEPOSITION [J].

MICHAILOVITS, L ;

BALI, K ;

SZORENYI, T ;

HEVESI, I .

ACTA PHYSICA ACADEMIAE SCIENTIARUM HUNGARICAE, 1980, 49 (1-3) :217-221

[9]

VALEYEV AS, 1963, OPT SPEKTROSK+, V15, P500

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