MAGNETIC-STRUCTURE ANALYSIS IN SCANNING ELECTRON-BEAM DEVICES BY MEANS OF THE LEED SPIN-POLARIZATION DETECTOR

被引：8

作者：

KIRSCHNER, J

机构：

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1985年 / 36卷 / 03期

关键词：

D O I：

10.1007/BF00624930

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：121 / 123

页数：3

共 11 条

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[8] SCANNING ELECTRON-MICROSCOPE OBSERVATION OF MAGNETIC DOMAINS USING SPIN-POLARIZED SECONDARY ELECTRONS
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[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1984, 23 (03): : L187 - L188
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