CONDUCTIVITY SENSITIVITY OF INELASTIC SCANNING TUNNELING MICROSCOPY

被引：73

作者：

BINNIG, G

GARCIA, N

ROHRER, H

机构：

来源：

PHYSICAL REVIEW B | 1985年 / 32卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.32.1336

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1336 / 1338

页数：3

共 17 条

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