MODELING OF ACCIDENTAL COINCIDENCES IN BOTH CONVENTIONAL AND TIME-OF-FLIGHT POSITRON-EMISSION TOMOGRAPHY

被引:9
作者
HOLMES, TJ [1 ]
FICKE, DC [1 ]
SNYDER, DL [1 ]
机构
[1] WASHINGTON UNIV,DEPT ELECT ENGN,ST LOUIS,MO 63110
关键词
D O I
10.1109/TNS.1984.4333332
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:627 / 631
页数:5
相关论文
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