ACCURATE INTERBAND-AUGER-RECOMBINATION RATES IN SILICON

被引:54
作者
LAKS, DB [1 ]
NEUMARK, GF [1 ]
PANTELIDES, ST [1 ]
机构
[1] IBM CORP,DIV RES,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
来源
PHYSICAL REVIEW B | 1990年 / 42卷 / 08期
关键词
D O I
10.1103/PhysRevB.42.5176
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Band-to-band Auger recombination is the dominant recombination mechanism in silicon at high carrier concentrations. Previous calculations found Auger rates too small to account for experiment. These calculations, however, contained uncontrolled approximations. We calculate accurate Auger recombination rates in both n-type and p-type silicon, avoiding approximations made in all prior Auger work. Our calculations show that Auger recombination is an order of magnitude stronger than previously thought. Our results for n-type Si agree well with experimental lifetimes. In contrast, a phonon-assisted mechanism is indicated for p-type Si. This conclusion can be understood based on details of the band structure. © 1990 The American Physical Society.
引用
收藏
页码:5176 / 5185
页数:10
相关论文
共 37 条
[1]  
ABAKUMOV VN, 1977, SOV PHYS SEMICOND+, V11, P766
[2]   A NUMERICAL-ANALYSIS OF AUGER PROCESSES IN P-TYPE GAAS [J].
BARDYSZEWSKI, W ;
YEVICK, D .
JOURNAL OF APPLIED PHYSICS, 1985, 57 (10) :4820-4822
[3]   COMPOSITIONAL DEPENDENCE OF THE AUGER COEFFICIENT FOR INGAASP LATTICE MATCHED TO INP [J].
BARDYSZEWSKI, W ;
YEVICK, D .
JOURNAL OF APPLIED PHYSICS, 1985, 58 (07) :2713-2723
[4]   AUGER TRANSITIONS IN SEMICONDUCTORS AND THEIR COMPUTATION [J].
BEATTIE, AR .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1985, 18 (35) :6501-6515
[5]   AUGER EFFECT IN SEMICONDUCTORS [J].
BEATTIE, AR ;
LANDSBERG, PT .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1959, 249 (1256) :16-29
[6]   CALCULATIONS OF OVERLAP INTEGRALS FOR AUGER PROCESSES INVOLVING DIRECT BAND-GAP SEMICONDUCTORS [J].
BRAND, S ;
ABRAM, RA .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (07) :L201-L206
[7]   CALCULATIONS OF THE COMMONLY NEGLECTED TERMS IN THE MATRIX ELEMENT FOR AUGER AND IMPACT IONIZATION PROCESSES IN SEMICONDUCTORS [J].
BRAND, S ;
ABRAM, RA .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (22) :L571-L574
[8]   OVERLAP INTEGRALS FOR AUGER RECOMBINATION IN DIRECT GAP III-V SEMICONDUCTORS - CALCULATIONS FOR CONDUCTION AND HEAVY HOLE BAND STATES WITH WAVEVECTORS ALONG THE (001) DIRECTION IN GAAS AND INP [J].
BURT, MG ;
SMITH, C .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (02) :L47-L52
[9]   OVERLAP INTEGRALS FOR AUGER RECOMBINATION IN DIRECT-BANDGAP SEMICONDUCTORS - CALCULATIONS FOR CONDUCTION AND HEAVY-HOLE BANDS IN GAAS AND INP [J].
BURT, MG ;
BRAND, S ;
SMITH, C ;
ABRAM, RA .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (35) :6385-6401
[10]   CALCULATION OF THE ZERO-TEMPERATURE AUGER RECOMBINATION RATE IN THE QUATERNARY SEMICONDUCTOR ALLOY GAALASSB [J].
BURT, MG .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1981, 14 (22) :3269-3278