DESIGN OF A 16-384-BIT SERIAL CHARGE-COUPLED MEMORY DEVICE

被引:8
作者
CHOU, S [1 ]
机构
[1] INTEL CORP,SANTA CLARA,CA 95051
关键词
D O I
10.1109/JSSC.1976.1050669
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:10 / 18
页数:9
相关论文
共 10 条
[1]  
AUGUSTA B, 1972, AFIPS C P 2, V41, P1261
[2]   FABRICATION AND PERFORMANCE CONSIDERATIONS OF CHARGE-TRANSFER DYNAMIC SHIFT REGISTERS [J].
BERGLUND, CN ;
STRAIN, RJ .
BELL SYSTEM TECHNICAL JOURNAL, 1972, 51 (03) :655-+
[3]  
COLLINS DR, 1973, 1973 IEEE INT SOL ST, P210
[4]  
COLLINS DR, 1973, 1973 IEEE INT SOL ST, P136
[5]  
IBRAHIM A, 1973, IEEE INT ELECTRON DE
[6]   CHARGE-COUPLES DIGITAL CIRCUITS [J].
KOSONOCKY, WF ;
CARNES, JE .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1971, SC 6 (05) :314-+
[7]   4160-BIT C4D SERIAL MEMORY [J].
KRAMBECK, RH ;
RETAJCZYK, TF ;
SILVERSMITH, DJ ;
STRAIN, RJ .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (06) :436-443
[8]   CHARGE-TRANSFER IN OVERLAPPING GATE CHARGE-COUPLED DEVICES [J].
MOHSEN, AM ;
MCGILL, TC ;
MEAD, CA .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1973, SC 8 (03) :191-207
[9]   PERFORMANCE OF VERY HIGH-DENSITY CHARGE COUPLED DEVICES [J].
PATRIN, NA .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1973, 17 (03) :241-248
[10]   BURIED CHANNEL CHARGE COUPLED DEVICE [J].
WALDEN, RH ;
SCHRYER, NL ;
SMITH, GE ;
STRAIN, RJ ;
MCKENNA, J ;
KRAMBECK, RH .
BELL SYSTEM TECHNICAL JOURNAL, 1972, 51 (07) :1635-+