TIME-DOMAIN MEASUREMENTS FOR TRANSISTOR AND NETWORK CHARACTERIZATION UP TO 1 GC

被引:8
作者
DAVIS, F
LOEB, HW
机构
来源
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS | 1965年 / 53卷 / 10期
关键词
D O I
10.1109/PROC.1965.4292
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
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页码:1649 / &
相关论文
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[4]   SPECTRUM ANALYSIS OF TRANSIENT RESPONSE CURVES [J].
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