STRUCTURE OF SPECIAL GRAIN-BOUNDARIES IN SIAION CERAMICS

被引：45

作者：

SCHMID, H

RUHLE, M

机构：

[1] Institut für Werkstoffwissenschaften, Max-Planck-Institut für Metallforschung, Stuttgart, Germany

来源：

JOURNAL OF MATERIALS SCIENCE | 1984年 / 19卷 / 02期

关键词：

D O I：

10.1007/BF02403250

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

MICROSCOPES, ELECTRON - MICROSCOPIC EXAMINATION

引用

页码：615 / 628

页数：14

共 32 条

[1]

Amelinckx S., 1970, Modern diffraction and imaging techniques in material science, P257

[2]

AMELINCKX S, 1976, ELECTRON MICROSCOPY

[3]

[Anonymous], 2012, CRYSTAL DEFECTS CRYS

[4] STRUCTURE OF HIGH-ANGLE GRAIN-BOUNDARIES IN METALS AND CERAMIC OXIDES [J].

BALLUFFI, RW ;

BRISTOWE, PD ;

SUN, CP .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1981, 64 (01) :23-34

[5] CSL DSC LATTICE MODEL FOR GENERAL CRYSTAL-CRYSTAL BOUNDARIES AND THEIR LINE DEFECTS [J].

BALLUFFI, RW ;

BROKMAN, A ;

KING, AH .

ACTA METALLURGICA, 1982, 30 (08) :1453-1470

[6] COINCIDENCE LATTICE MODEL FOR THE STRUCTURE AND ENERGY OF GRAIN-BOUNDARIES [J].

BROKMAN, A ;

BALLUFFI, RW .

ACTA METALLURGICA, 1981, 29 (10) :1703-1719

[7] HIGH-RESOLUTION TECHNIQUES AND APPLICATION TO NONOXIDE CERAMICS [J].

CLARKE, DR .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1979, 62 (5-6) :236-246

[8] GRAIN-BOUNDARY PHASES IN A HOT-PRESSED MGO FLUXED SILICON-NITRIDE [J].

CLARKE, DR ;

THOMAS, G .

JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1977, 60 (11-1) :491-495

[9] DETECTION OF THIN INTERGRANULAR FILMS BY ELECTRON-MICROSCOPY [J].

CLARKE, DR .

ULTRAMICROSCOPY, 1979, 4 (01) :33-44

[10] MICROSTRUCTURES OF SILICON-NITRIDE CERAMICS DURING HOT-PRESSING TRANSFORMATIONS [J].

DREW, P ;

LEWIS, MH .

JOURNAL OF MATERIALS SCIENCE, 1974, 9 (02) :261-269

← 1 2 3 4 →