A DIRECT MEASUREMENT OF THE SOURCE PROFILE OF THE DARESBURY SRS

被引：11

作者：

HART, M

SIDDONS, DP

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 204卷 / 01期

关键词：

D O I：

10.1016/0167-5087(82)90099-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：219 / 221

页数：3

共 7 条

[1] MULTIPLE BRAGG REFLECTION MONOCHROMATORS FOR SYNCHROTRON-X RADIATION [J].

BEAUMONT, JH ;

HART, M .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (10) :823-829

[2] TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION - (SI GE CRYSTALS - E/T) [J].

BONSE, U ;

HART, M .

APPLIED PHYSICS LETTERS, 1965, 7 (09) :238-&

[3] X-RAY MONOCHROMATORS AND RESONATORS FROM SINGLE CRYSTALS [J].

DESLATTES, RD .

APPLIED PHYSICS LETTERS, 1968, 12 (04) :133-+

[4] CRYSTAL WAVELENGTH CALIBRATORS FOR SYNCHROTRON X-RAY SPECTROMETERS [J].

HART, M .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1979, 12 (10) :911-912

[5]

Hart M., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P421

[6]

HART M, 1979, LECTURE NOTES PHYSIC, V112, P325

[7]

LEA KR, SYNCHROTRON RAD SOUR

← 1 →