SURFACE-ENHANCED RAMAN-SPECTROSCOPY OF CHEMICAL VAPOR-DEPOSITED DIAMOND FILMS

被引：69

作者：

KNIGHT, DS

WEIMER, R

PILIONE, L

WHITE, WB

机构：

来源：

APPLIED PHYSICS LETTERS | 1990年 / 56卷 / 14期

关键词：

D O I：

10.1063/1.102505

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

By using surface-enhanced Raman spectroscopy it was possible to clearly identify very thin diamond and amorphous carbon coatings which were not detectable by normal Raman spectroscopy. A very small amount of silver was sputtered onto the surface of thin diamond depositions. Raman spectra measured through the silver layer exhibited the 1332 cm-1 diamond line and broadbands due to other forms of carbon. Raman scattering measured through silver coatings directly on the silicon substrate revealed extremely thin layers of amorphous carbon.

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页码：1320 / 1322

页数：3

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