HOW TO OBTAIN MAXIMUM PRACTICAL PERFORMANCE FROM STATE-OF-THE-ART DELTA-SIGMA ANALOG-TO-DIGITAL CONVERTERS

被引：11

作者：

LAMAY, JL

BOGARD, HT

机构：

[1] Crystal Semiconductor Corporation, Austin

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1992年 / 41卷 / 06期

关键词：

D O I：

10.1109/19.199423

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Obtaining maximum performance from a state-of-the-art Delta-Sigma Analog-to-Digital Converter (AD) requires a basic understanding of noise sources and of the delta-sigma architecture. This paper provides a brief review of delta-sigma operation, common noise sources, and modes of noise propagation. This is followed up with a discussion of techniques used in test manufacturing and applications which have proven to reduce noise.

引用

页码：861 / 867

页数：7