A STUDY OF (222) FORBIDDEN REFLECTION IN GERMANIUM AND SILICON

[1] BENNEMANN KH, 1964, PHYS REV, V133, P1045

[2] ELECTRONIC DISTRIBUTION IN DIAMOND AND INTENSITIES OF X-RAY REFLECTIONS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1961, 78 (500): : 239 - &

[3] Bragg WH, 1921, P PHYS SOC LOND, V33, P304

[4] ON THE INFLUENCE OF BINDING ELECTRONS ON X-RAY INTENSITIES [J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (03): : 275 - 276

[5] SIMULTANEOUS DIFFRACTION - INDEXING UMWEGANREGUNG PEAKS IN SIMPLE CASES [J]. ACTA CRYSTALLOGRAPHICA, 1962, 15 (FEB): : 138 - &

[6] EFFECTS OF FAST NEUTRON IRRADIATION AND OF IMPURITIES ON X-RAY INTENSITIES DIFFRACTED BY GERMANIUM AND SILICON CRYSTALS [J]. PHYSICA STATUS SOLIDI, 1966, 14 (01): : 81 - &

[7] CRAWFORD TH, 1956, P INT C PEAC US AT E, V7, P659

[8] ABSOLUTE X-RAY SCATTERING FACTORS OF SILICON AND GERMANIUM [J]. PHYSICAL REVIEW, 1965, 137 (6A): : 1869 - &

[9] Ewald PP, 1936, ANN PHYS-BERLIN, V25, P0281

[10] GOTTLICHER S, 1959, Z PHYS CHEM, V21, P133

[1] BENNEMANN KH, 1964, PHYS REV, V133, P1045

[2] ELECTRONIC DISTRIBUTION IN DIAMOND AND INTENSITIES OF X-RAY REFLECTIONS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1961, 78 (500): : 239 - &

[3] Bragg WH, 1921, P PHYS SOC LOND, V33, P304

[4] ON THE INFLUENCE OF BINDING ELECTRONS ON X-RAY INTENSITIES [J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (03): : 275 - 276

[5] SIMULTANEOUS DIFFRACTION - INDEXING UMWEGANREGUNG PEAKS IN SIMPLE CASES [J]. ACTA CRYSTALLOGRAPHICA, 1962, 15 (FEB): : 138 - &

[6] EFFECTS OF FAST NEUTRON IRRADIATION AND OF IMPURITIES ON X-RAY INTENSITIES DIFFRACTED BY GERMANIUM AND SILICON CRYSTALS [J]. PHYSICA STATUS SOLIDI, 1966, 14 (01): : 81 - &

[7] CRAWFORD TH, 1956, P INT C PEAC US AT E, V7, P659

[8] ABSOLUTE X-RAY SCATTERING FACTORS OF SILICON AND GERMANIUM [J]. PHYSICAL REVIEW, 1965, 137 (6A): : 1869 - &

[9] Ewald PP, 1936, ANN PHYS-BERLIN, V25, P0281

[10] GOTTLICHER S, 1959, Z PHYS CHEM, V21, P133