MEASUREMENT OF RADIATION-INDUCED CONDUCTIVITY FOR HARDENED CABLE DIELECTRIC MATERIALS AT HIGH FLUENCE

被引：7

作者：

FACE, SH

EKLUND, CA

STRINGER, TA

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1983年 / 30卷 / 06期

关键词：

D O I：

10.1109/TNS.1983.4333153

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：4450 / 4456

页数：7

共 10 条

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[2] DOSE AND DOSE-RATE DEPENDENCE OF INDUCED CONDUCTIVITY IN DIELECTRICS [J].

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[3] X-RAY-INDUCED PHOTOCONDUCTIVITY IN DIELECTRIC MATERIALS [J].

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[4]

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[5]

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[6] DIELECTRIC CONDUCTIVITY EFFECTS AT HIGH FLUENCE IN FILLED CABLES WITH SMALL RESIDUAL GAPS [J].

STRINGER, TA ;

EKLUND, CA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :4262-4268

[7] METHOD FOR ROUTINE MEASUREMENT OF DIELECTRIC PHOTOCONDUCTIVITY [J].

SULLIVAN, WH ;

EWING, RL .

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[8]

VANLINT VAJ, 1969, IEEE T NUCL SCI, V16, P194

[9]

WARBURTON MR, 1982, MRCSDR109 MISS RES C

[10]

WEIGART RC, 1972, IEEE T NUCL SCI, V19, P15

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