A NEW X-RAY TOPOGRAPHIC DEFECT CONTRAST ON SWEPT QUARTZ CRYSTALS

被引：15

作者：

SEBASTIAN, MT ^{[1
]}

ZARKA, A ^{[1
]}

CAPELLE, B ^{[1
]}

机构：

[1] UNIV PARIS 07,F-75221 PARIS 05,FRANCE

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1988年 / 21卷 / 04期

关键词：

Anode side - Defect contrast - Lattice strain - Negative space charge - Quartz crystal - Topographic defects - X ray irradiation - X-ray topographs;

D O I：

10.1107/S0021889888002614

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：326 / 329

页数：4

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