APPLICATION OF CAUSALITY CONDITION TO THIN-FILM SPECTROSCOPY - METHOD FOR EVALUATION OF THICKNESS AND OPTICAL-CONSTANTS

被引：6

作者：

ROTH, J ^{[1
]}

RAO, B ^{[1
]}

DIGNAM, MJ ^{[1
]}

机构：

[1] UNIV TORONTO,DEPT CHEM,TORONTO M5S 1A1,ONTARIO,CANADA

来源：

JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS II | 1975年 / 71卷 / 01期

关键词：

D O I：

10.1039/f29757100086

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：86 / 94

页数：9

共 15 条

[1] KRAMERS-KRONIG DISPERSION ANALYSIS OF INFRARED REFLECTANCE BANDS [J].

ANDERMANN, G ;

CARON, A ;

DOWS, DA .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (10P1) :1210-+

[2] POLARIMETRIC DETERMINATION OF ABSORPTION SPECTRA OF THIN FILMS ON METAL .1. INTERPRETATION OF OPTICAL DATA [J].

BARTELL, LS ;

CHURCHIL.D .

JOURNAL OF PHYSICAL CHEMISTRY, 1961, 65 (12) :2242-&

[3]

BEATTIE JR, 1955, PHILOS MAG, V46, P235

[4]

Bockris J.O.M., 1970, MODERN ELECTROCHEMIS

[5]

Churchill R. V., 1948, INTRO COMPLEX VARIAB

[6] ELLIPSOMETRIC DETERMINATION OF SPECTRA OF ADSORBED MOLECULES [J].

DIGNAM, MJ ;

RAO, B ;

MOSKOVIT.M ;

STOBIE, RW .

CANADIAN JOURNAL OF CHEMISTRY, 1971, 49 (07) :1115-&

[7] ANODIC BEHAVIOR OF SILVER IN ALKALINE SOLUTIONS [J].

DIGNAM, MJ ;

BARRETT, HM ;

NAGY, GD .

CANADIAN JOURNAL OF CHEMISTRY, 1969, 47 (22) :4253-&

[8] AZIMUTHAL MISALIGNMENT AND SURFACE ANISOTROPY AS SOURCES OF ERROR IN ELLIPSOMETRY [J].

DIGNAM, MJ ;

MOSKOVIT.M .

APPLIED OPTICS, 1970, 9 (08) :1868-&

[9]

HEAVENS OS, 1964, PHYSICS THIN FILMS, V2

[10]

Landau L.D., 1984, ELECTRODYNAMICS CONT, V2nd ed.

← 1 2 →