SURFACE STUDIES BY CRYSTAL CURRENT MEASUREMENT OF X-RAY-INDUCED SECONDARY-ELECTRON EMISSION .1. APPLICATION TO METAL OVERLAYER GROWTH - CU ON NI(100)

被引：9

作者：

CHADWICK, D

KAROLEWSKI, MA

SENKIW, K

机构：

来源：

关键词：

D O I：

10.1016/0039-6028(86)90003-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：L801 / L805

页数：5

共 8 条

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[5] SURFACE STUDIES BY CRYSTAL CURRENT MEASUREMENT OF X-RAY-INDUCED SECONDARY-ELECTRON EMISSION .2. APPLICATION TO MOLECULAR ADSORPTION - CO, C2H4, O-2 AND H-2 ON NI(100)
KAROLEWSKI, MA
CHADWICK, D
[J]. SURFACE SCIENCE, 1986, 175 (03) : L806 - L810
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[J]. SURFACE SCIENCE, 1983, 130 (01) : 191 - 202
[8] NILSSON A, 1985, SURFACE SCI, V1562, P247