POSITRON LIFETIME MEASUREMENTS IN N-TYPE AND P-TYPE SILICON

被引:14
作者
DORIKENS, M [1 ]
DAUWE, C [1 ]
DORIKENS.L [1 ]
机构
[1] RIJKS UNIV GHENT,NATUURKUNDIG LAB,PROEFTUIN STR 86,B-9000 GHENT,BELGIUM
来源
APPLIED PHYSICS | 1974年 / 4卷 / 03期
关键词
D O I
10.1007/BF00884239
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:271 / 272
页数:2
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