ANALYSIS OF INHOMOGENEOUS THIN-FILMS BY SPECTROPHOTOMETRIC MEASUREMENTS

被引:17
作者
PIEGARI, A
EMILIANI, G
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D O I
10.1016/0040-6090(89)90631-7
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T [工业技术];
学科分类号
08 ;
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页码:243 / 250
页数:8
相关论文
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[2]  
Jacobsson R., 1966, PROG OPT, V5
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Jacobsson R., 1975, PHYS THIN FILMS, V8, P51
[4]  
PIEGARI A, 1986, SOC PHOTOOPT INSTRUM, V652, P64
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