CALCULATION OF RELATIVE X-RAY-FLUORESCENCE INTENSITY FOR ANNULAR-SOURCE GEOMETRY BY THE MONTE-CARLO METHOD

被引:19
作者
TANG, SM
KUMP, P
YAP, CT
BILAL, MG
机构
关键词
D O I
10.1002/xrs.1300150412
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
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页码:289 / 293
页数:5
相关论文
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GIAUQUE RD, 1971, ADV XRAY ANAL, V15, P164
[2]  
JENKINS R, 1981, QUANTITATIVE XRAY SP
[3]  
SPARKS CJ, 1976, ADV XRAY ANALYSIS, V19, P19
[4]  
Storm E., 1970, ATOM DATA NUCL DATA, V7, P565, DOI DOI 10.1016/S0092-640X(70)80017-1
[5]   AN XRF METHOD FOR THE DETERMINATION OF THE EFFICIENCY OF SI(LI) DETECTORS IN AN EXTENDED-SOURCE GEOMETRY BY USING THICK SPECIMENS [J].
TANG, SM ;
KUMP, P ;
YAP, CT ;
BILAL, MG .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1985, 241 (2-3) :503-506