OPTICAL-SURFACE ANALYSIS OF THE HEAD-DISK-INTERFACE OF THIN-FILM DISKS

被引:28
作者
MEEKS, SW
WERESIN, WE
ROSEN, HJ
机构
[1] IBM Research Division, Aimaden Research Center, San Jose, CA, 95120-6099
来源
JOURNAL OF TRIBOLOGY-TRANSACTIONS OF THE ASME | 1995年 / 117卷 / 01期
关键词
D O I
10.1115/1.2830584
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
This paper describes the design, operation, theory, and data interpretation of an Optical Surface Analyzer (OSA). The OSA can measure carbon wear, lubricant depletion/accumulation, surface roughness, and lubricant alteration on carbon coated thin film disks. This device can measure an Angstrom of carbon wear or lubricant depletion/accumulation. The OSA can also measure debris generation and lubricant degradation through a measurement of optical index change. The lateral resolution of the OSA is approximately 5 by 10 microns and the bandwidth of the device is 2 MHz. The small device size allows it to be used within a test stand environment.
引用
收藏
页码:112 / 118
页数:7
相关论文
共 13 条
[1]  
ASSAM RMA, 1976, ELLIPSOMETRY POLARIZ
[2]   MICRO KELVIN PROBE FOR LOCAL WORK-FUNCTION MEASUREMENTS [J].
BAUMGARTNER, H ;
LIESS, HD .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (05) :802-805
[3]  
Benninghoven A., 1987, SECONDARY ION MASS S
[4]   DEVICE FOR MEASURING CONTACT POTENTIAL DIFFERENCES WITH HIGH SPATIAL-RESOLUTION [J].
BUTZ, R ;
WAGNER, H .
APPLIED PHYSICS, 1977, 13 (01) :37-42
[5]   RESIDUAL SURFACE-ROUGHNESS OF DIAMOND-TURNED OPTICS [J].
CHURCH, EL ;
ZAVADA, JM .
APPLIED OPTICS, 1975, 14 (08) :1788-1795
[6]  
JEN D, 1992, ADV INFO STORAGE SYS, V4, P219
[7]   MOLECULAR-CONFORMATION AND DISJOINING PRESSURE OF POLYMERIC LIQUID-FILMS [J].
MATE, CM ;
NOVOTNY, VJ .
JOURNAL OF CHEMICAL PHYSICS, 1991, 94 (12) :8420-8427
[8]   MIGRATION OF LIQUID POLYMERS ON SOLID-SURFACES [J].
NOVOTNY, VJ .
JOURNAL OF CHEMICAL PHYSICS, 1990, 92 (05) :3189-3196
[9]  
RUDGE V, 1993, IBM INTERNAL SOFTWAR
[10]  
SPILLER E, 1994, SOFT XRAY OPTICS, P134